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Contacts

ARCES

Via Vincenzo Toffano 2/2

40125 - Bologna - Italy

tel: +39 0512095422

fax: +39 0512095410

The electronic mailbox receives only messages coming from other certified e-mailboxes. E-mails sent from non certified e-mail addresses won’t be delivered.
arces.centro@pec.unibo.it
 
Sections
  • Power devices modeling and characterization continue
  • ICs for energy harvesting and micro-power conversion continue
  • Smart powerless and wireless IoT nodes continue
  • Developement of Hall effect system-on-chip continue
  • Advanced architectures for silicon based solar cells continue

Focus On

NOTICE of SUMMER SCHOOL: SINANO 2016, Bertinoro (FC, Italy) on October 16-21, 2016. For PhD students and postdoctoral researchers in the field of modeling and reliability of electronic devices. -
The 7th European SINANO Summer School is co-organized by the ARCES Research Center of the University of Bologna and by the Italian Inter-University Consortium for Nanoelectronics (IUNET). The school is devoted to various aspects of modeling and simulation, with contributions from European projects (NEREID) and other EU initiatives.
Sensors and Embedded Systems for Structural Health Monitoring Applications
In the context of the monitoring of aircraft, the aim is the implementation of an embedded, cheap and miniaturized sensor node integrating piezoelectric transducers to detect the presence of damages that might lead to failure of the structure by means of Lamb wave inspections.
Computer Vision: image analysis and scene understanding
The Computer Vision Group (CVG) is involved into projects concerning image analysis and scene understanding in different fields of computer vision, pattern recognition and signal processing. In particular, CVG is involved in bio-medical research activities aiming at introducing image-based technologies to assist or replace human assessment in quality control.
Electrical Neuroimaging and stimulation
Next-generation electrodes and efficient software for the acquisition of neuroimages and stimulation of brain activity.
Integrated power devices
The reliability is one of the key challenges in building power devices for next generation Smart-Power technology. Special care needs to be devoted to the characterization and modeling of the long-term degradation. State-of-the-art techniques based on accelerated stress conditions and noise measurements are used in our laboratories.

Calls for application / Bandi di selezione (text and documents uploaded in this section are in Italian)

Published calls of competition, relevant documentation and archive

European active projects

Contacts

ARCES

Via Vincenzo Toffano 2/2

40125 - Bologna - Italy

tel: +39 0512095422

fax: +39 0512095410

The electronic mailbox receives only messages coming from other certified e-mailboxes. E-mails sent from non certified e-mail addresses won’t be delivered.
arces.centro@pec.unibo.it