General Info
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Home  General Info Laboratory of microelectronics
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Laboratory of microelectronics |
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 Characterization of electronics systems and devices based on innovative VLSI circuits and nanoscale technologies.
Viale Risorgimento, 2 Bologna, Italy
| Workplace description |
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Workplace
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Featuring tool
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Workplace description
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ASIC
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Logic State Analyzer, Agilent Technologies 16702B |
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Digital Systems Debug, Verification & Characterization
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Board development system
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Board development system, T-Tech Quick circuit system |
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DSP/FPGA
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ALTERA development system and general purpose strumentation
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General Purpose 1
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Oscilloscopes, digital multimeters, function generators, data acquisition, power supplies
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General Purpose 2
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Oscilloscopes, digital multimeters, function generators, data acquisition, power supplies
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LF-DC
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LCR Meter, HP 4284A
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Precision Semiconductor Parameter Analyzer, Agilent Technologies 4156C
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Precision Semiconductor Parameter Analyzer, Agilent Technologies 41501B (4156C Expander ) |
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Semiconductor devices characterization
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Probe Station
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Probe Station, Cascade Summit 11751 |
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On wafer measurements
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RF
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Network Analyzer, HP 8719D
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VCO/PLL Test System , Agilent Technologies 4352B
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Downconverter unit, Agilent Technologies 43521A
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Noise Figure Analyzer, Agilent Technologies N8975A
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Noise Source, Agilent Technologies N4000A
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RF Signal Generators, HP E4422B
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RF Signal Generator, Agilent Technologies E4437B ESG-DP
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Spectrum Analyzer, HP 8563E
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Calibration Kit, Agilent Technologies 85052C
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High frequency probe, HP 85024A
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Network Analyzer, Agilent Technologies E5071B |
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Devices and circuits characterization in the RF range
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| Featuring tools description and list |
| Instrument |
Specifications Summary |
Recommended Configuration |
Data sheet |
serial number
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| Board
development
system, T-Tech Quick circuit system
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Calibration
Kit, Agilent Technologies 85052C
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3.5 mm connector |
Network Analyzer, HP 8719D
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| Downconverter
unit, Agilent Technologies 43521A
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3 GHz-12.6 GHz (for use with 43521A) |
VCO/PLL Test System , Agilent Technologies 4352B
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JP1KG00283 |
| High
frequency
probe, HP 85024A |
300 kHz-3 GHz |
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| LCR
Meter, HP 4284A
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opt. 001, 20 Hz-1 MHz |
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2940J10469 |
| Logic
State
Analyzer, Agilent Technologies 16702B
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3
16720 48 CH pattern generator cards with 8 MV memory depth (144 CH
total), 2 16717A 333 MHz 68 CH Logic Analyzer cards (136 CH) |
Oscilloscope, Agilent Technologies Infinium 54825A
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| 16720
16 CH pattern
generator card with 8 MV memory depth |
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US39380642 |
| 16720
16 CH pattern
generator card with 8 MV memory depth |
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US39380643
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| 16720
16 CH pattern
generator card with 8 MV memory depth |
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US39380644 |
| 16717A
333 MHz 68 CH
Logic Analyzer cards (136 CH) |
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US39333740 |
| 16717A
333 MHz 68 CH
Logic Analyzer cards (136 CH) |
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US39333739 |
Network Analyzer, HP 8719D
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3.5 mm test port conector, opt. 1D5 (high stability frequency reference), opt. 400, 50 MHz-13.5 GHz |
Calibration Kit, Agilent Technologies 85052C
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Network Analyzer, Agilent Technologies E5071B
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opt 214 (extended power range -50dBm to 10 dBm), opt 1E5 (High stability time base), 300 KHz - 8.5 GHz |
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Noise
Figure Analyzer, Agilent Technologies N8975A
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opt. 1D5 (high stability frequency reference), 10 MHz-26.5 GHz |
Noise Source, Agilent Technologies N4000A
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GB40390139 |
| Noise
Source, Agilent Technologies N4000A
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3.5 mm connector, 10 MHz-18 GHz |
Noise Figure Analyzer, Agilent Technologies N8975A
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| Precision
Semiconductor Parameter Analyzer, Agilent
Technologies 41501B(4156C Expander) |
opt. 412, 1 GNDU, 1 HPSMU (high power SMU) 1 A / 20 V, 50 mA / 200 V, 2 PGU (pulse generator unit) |
Precision Semiconductor Parameter Analyzer, Agilent Technologies 4156C
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JP10E00285 |
| Precision
Semiconductor Parameter Analyzer, Agilent
Technologies 4156C |
4 HRSMU (high resolution SMU) 1 fA / 2 uV, 2 VSMU, 2VMU |
Precision Semiconductor Parameter Analyzer, Agilent Technologies 41501B (4156C Expander )
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JP10J00109 |
| Probe
Station, Cascade Summit 11751
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8in.
manual, fem-to-guarded microchamber with controlled athmosphere
(Nitrogen), 7 DC and 2 RF probe (up to 40 GHz), thermal control 0-200C |
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| RF
Signal
Generator, Agilent Technologies E4437BF ESG-DP
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digital and analog signal generator opt. UN8, UND, phase noise -130 dBc/Hz @ 20kHz offset 1GHz carrier), , 250 kHz - 4 GHz |
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US39260824 |
RF
Signal
Generators, HP E4422B
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260 kHz-4 GHz |
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| Spectrum
Analyzer, HP 8563E
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opt. 026 (3.5 mm connector), HP85671A (phase noise meas.), HP85672A (spurius response meas.), 9 kHz-26.5 GHz |
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3846A10564 |
| VCO/PLL
Test System, Agilent Technologies 4352B
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10 MHz-12.6 GHz (with 43521A) |
Downconverter unit, Agilent Technologies 43521A
RF Signal Generator, Agilent Technologies E4437B ESG-DP
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JP2KE00884 |
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| Non-featuring tools list |
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Instrument
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Specifications Summary
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Recommended Configuration
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Data sheet |
| Dynamic
Signal
Analyzer, HP 35670A
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2 channel FFT-base spectrum / network analyzer, opt. 1D2 (swept sine and tracking receiver), DC to 100 kHz |
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Function
Generator, Agilent Technologies 33250A
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sine, square and ramp wave outputs with pulse capabilities, frequency range 80 MHz |
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| Function
Generator, Agilent Technologies 33250A
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sine, square and ramp wave outputs with pulse capabilities, frequency range 80 MHz |
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| Function
Generator, HP 8116A
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frequency range 50 MHz |
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| Function
Generator
and Waveform Synthesizer, HP 8904A
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Sine waveform from 0.1 Hz to 600 kHz, square, triangle, ramp, pulse waveforms from 0.1 Hz to 50 kHz,opt. 001 |
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| Oscilloscope, LeCroy LT344
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4 channels, 500 MSa/s sample rate, opt. LTXXX-EMM (Math functions), bandwidth 500 MHz |
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| Oscilloscope, LeCroy LC534AL
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4 channels, 2GSa/s max sample rate, 8MB memory depth, bandwidth 1 GHz |
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Oscilloscope, Agilent
Technologies Infinium 54825A
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4 channels, 2 GSa/s sample rate, bandwidth 500 MHz |
Logic State Analyzer, Agilent Technologies 16702B
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| Oscilloscope, Tektronix TDS3054
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4 channels, 5 GSa/s sample rate, bandwidth 500 MHz |
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| Oscilloscope, Agilent
Technologies 54616B
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2 channels, 2 GSa/s sample rate, bandwidth 500 MHz |
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| Power
supply, Agilent Technologies E3630A |
triple output |
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| Power
supply, Agilent Technologies E3631A
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triple output |
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| Power
supply, Agilent Technologies E3630A |
triple output |
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| Power
supply, HP 6626A
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| Power
supply, Agilent Technologies E3631A |
triple output |
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Power
supply, Agilent Technologies E3631A
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triple output |
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| Power
supply, Agilent Technologies E3620A |
2 outputs, 0 to 25 V, 0 to 1 A, 50 W |
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Spectrum
Analyzer, Agilent Technologies E4402B
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opt. 1DR and 1DS, 9 kHz -3 GHz |
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The Applied & Computational Algebraic Topology (ACAT) Avanced School
will be held in Bologna on May 25-26, 2012.
The school will be followed by the 4th International Workshop on Computational Topology in Image Context (CTIC 2012), that will be held in Bertinoro on May 28-30, under the patronage of ARCES.
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Read more...
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ARCES Research Projects started in 2012:
1 - Novel device and circuit concepts for energy-efficient electronics (FIRB)
2 - GRC Research 2257 “Modeling of Package Influences on High-voltage semiconductor FETs” (SRC)
3 - E2SG - Energy to Smart Grid (ENIAC-JTI)
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Read more...
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ARCES invited Prof. Willy Sansen, emeritus of K.U. Leuven (Belgium), for a talk about "Power Optimization in Analog CMOS Integrated Circuits" (Faculty of Engineering in Bologna, 2nd May 2012)
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Read more...
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ARCES researcher Elena Gnani delivered an invited talks at the MOS-AK/GSA Workshop “Over Two Decades of Enabling Compact Modeling R&D Exchange” (Dresden, Germany, 26-27 April 2012)
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Read more...
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ARCES research group coordinated by Prof. Tullio Salmon Cinotti was invited to present a poster at the Inauguration Day of the Italian node of EIT-ICT Labs (Trento, 18th April 2012)
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Read more...
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